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  • Tutorials

    ICSE-10 will offer one day of complimentary Tutorials and a Welcome Reception on Sunday, June 8, 2025.

    CNRS, École Polytechnique (France)

    Imaging Mueller Polarimetry: From Metrology to Biomedicine

    Dr. Tatiana Novikova leads the Division of Characterization and Modeling at the Laboratory of Physics of Interfaces and Thin Films of CNRS, Ecole polytechnique, Institut Polytechnique de Paris, France. She is a Courtesy Professor of the Department of Biomedical Engineering, Florida International University, Miami, FL, USA. Dr Novikova obtained MSc degree in applied mathematics from the Moscow State University (Russia), PhD in applied mathematics and physics from the Moscow Institute of Mathematical Modelling (Russia), and Habilitation in Physics from the University Paris-Sud (France). Her research interests and area of expertise include optical polarization, Mueller polarimetry, biomedical imaging, polarimetric instrumentation, optical metrology and computational modeling of electromagnetic wave interaction with structured and random media. Dr. Novikova is an Editorial Board member of the SPIE Journal of Biomedical Optics, co-Editor of the book “Polarized Light in Biomedical Imaging and Sensing – Clinical and Pre-Clinical Applications” (Springer Cham, 2023), Vice-Chair of SPIE Poincaré Webinar Series on Optical Polarization and Related Phenomena. Dr. Novikova is the Fellow of SPIE and Optica (former OSA), and the recipient of 2020 SPIE G. G. Stokes Award in optical polarization.

    The University of Toledo (USA)

    Data Analysis:  Turning Bad Models into Good Results

    Nik received his BS and MS degrees in Physics in 2003 and 2004 from the Pennsylvania State University and his PhD in Physics in 2008 from the University of Toledo. In 2011, he joined the faculty at University of Toledo where his current research involves optical characterization of materials and thin film devices, complex optical property measurements from the millimeter to ultraviolet wavelength ranges, in situ real time monitoring of materials growth, non-contacting probes of electronic transport properties, thin film photovoltaics, and modeling of opto-electronic devices. Nik is currently the NEG Endowed Chair Professor and Chair of the Department of Physics and Astronomy at the University of Toledo.

    Eindhoven University of Technology (The Netherlands)

    In-Situ Spectroscopic Ellipsometry during Atomic Layer Deposition and Related Processes

    Erwin Kessels received his M.Sc. and Ph.D. degree in Applied Physics from the Eindhoven University of Technology (TU/e) in 1996 and 2000, respectively. He is currently a professor at the same university and his research interests cover the field of synthesis of ultrathin films and nanostructures using methods such as layer deposition (ALD) and atomic layer etching (ALE). He has contributed most prominently by his work on plasma-enhanced ALD, his research related to ALD for semiconductor technology and photovoltaics, ALD for nanopatterning, and in situ spectroscopic studies of ALD and ALE. Erwin has won several awards (the AVS Peter Mark Memorial Award in 2007; the ALD Innovation Award in 2019) and he is an associate editor of the Journal of Vacuum Science and Technology. He is also the driving force behind the AtomicLimits.com blog and the founder of the ALD Academy.

    Florida International University (USA)

    Artificial Intelligence and Machine Learning in Ellipsometry

    Professor Frank Urban received his BSEE and MS in Electrical Engineering from The Ohio State University, and MS and PhD in Materials Science and Engineering from the University of Florida. After working for Harris Semiconductor Frank joined the University of Miami’s Department of Electrical Engineering as Assistant Professor. He then joined the Department of Electrical and Computer Engineering at Florida International University as Associate Professor. Frank’s interest include thin film formation using Ionized Cluster Beam, Nanoparticle films, and others (1980 – present), characterization of materials’ properties using ellipsometry (1980 – present), and modeling methods including numerical methods and artificial intelligence for function approximation (1992 – present). Fields of interest comprise nanoparticles, optics, endocrinology, and computer Matlab©. He also enjoys triathlon racing, cycling, and wilderness hiking.

    University of Nebraska-Lincoln (USA) & Lund University (Sweden)

    The Eigenpolarization Model: A physics approach to render the susceptibility tensors of anisotropic materials

    Mathias received Dipl.-Phys., Dr. rer. nat., and Dr. habil. (Physics) degrees from the University of Leipzig in 1994, 1997, and 2003, respectively. He joined the University of Nebraska-Lincoln as full-time faculty in 2005. He visited Linkoping University as guest professor (2016-2022) and Lund University (2023-). He was named Fellow of the Leibniz Institut fuer Polymerforschung Dresden and the American Physical Society. Mathias holds an honorary doctorate from Linkoping University and he is endowed with the J.A. Woollam Distinguished Professorship Chair. He serves as Commissioning Editor for Applied Physics Letters. Mathias’ research interests cover development and applications of advanced ellipsometry.

  • Fourth Announcement

    Dear colleagues,

    The ICSE-10 official website is now online.

    Stay tuned for important updates about the abstract submission timeline, conference schedule, award nominations, and speaker invitations.

    At this time we anticipate ICSE-10 to be a fully in-person meeting.

    Please encourage your colleagues and collaborators interested in participating to subscribe to our website icse10.ellipsometry.us

    Please direct questions and inquiries to icse10@ellipsometry.us

    We look forward to welcoming you to Boulder, Colorado June 8-13 2025.

    The ICSE-10 organizers

  • Third Announcement

    We proudly announce the 10th International Conference on Spectroscopic Ellipsometry ICSE10 which will be held in Colorado, U.S.A., June 8-13, 2025. The main organizing team consists of Eva Schubert from the University of Nebraska-Lincoln, David Aspnes from North Carolina State University, Alain Diebold from University at Albany, SUNY  and Mathias Schubert also from Nebraska.

    ICSE is a conference series which was founded in 1993 and is held every three years to share new ideas related to ellipsometry applications such as materials characterization, real-time process analysis, and instrumentation development utilizing the polarization properties of electromagnetic waves in the spectral region from Terahertz to soft-X-ray wavelengths. The conference brings together an international cohort of experienced scientists and leaders of the community, as well as many graduate students, PostDoc’s, and other early career professionals.

    ICSE-10 is committed to the development of a collaborative, inclusive, diverse, and internationally conscious workforce, and is seeking opportunities to increase participation of a diverse and inclusive population of undergraduate and graduate students, but also PostDoc’s, and early career professionals.

    Please mark your calendars and stay tuned for further information. A website will be launched soon and abstract submission details will be provided.

    We look forward to welcoming you in Colorado in 2025!

    Eva Schubert, David Aspnes, Alain Diebold, and Mathias Schubert

  • Second Announcement

  • First Announcement

    Dear Spectroscopic Ellipsometry Community,

    We look forward to welcoming you to ICSE-10, which will be held 08-13 June 2025 at the Conference Center of the University of Colorado – Boulder. Boulder is located at the base of the foothills of the Rocky Mountains, less than a one-hour drive from the Denver Airport.

    ICSE-10 will follow the organization of previous ICSE conferences. Honorary, Advisory, Program, and Local Arrangements Committees will be formed over the next few months and tasked with specific responsibilities. Volunteers are gladly accepted.

    We will be sending you further informational Emails once the ICSE-10 Website has been established and more details become available.

    We look forward to seeing you there!

    Mathias Schubert (University of Nebraska, Lincoln)
    David Aspnes (North Carolina State University)
    Alain Diebold (CNSE, SUNY Polytechnic Institute)

Logo of the Platinum Sponsor: University of Nebraska-Lincoln, Department of Electrical and Computer Engineering
Logo of the Arbeitskreis Ellipsometrie (AKE) - Paul Drude e.V.