Logo of the U.S. National Science Foundation
Logo of the Platinum Sponsor: J.A. Woollam Co., Inc.

Welcome Message

You are cordially invited to the 10th International Conference on Spectroscopic Ellipsometry, ICSE-10, to be held 08-13 June 2025 at the University of Colorado, Boulder, Colorado. 

The ICSE Conferences are the premier gatherings of experts and non-experts alike to share knowledge and learn about the latest advances and applications of spectroscopic ellipsometry and related techniques.  The meeting consists of a wide variety of tutorials, invited talks, presentations, and posters that cover all aspects of the field, and provides ample opportunities for networking and discussion.  The equipment display will cover the latest not only in ellipsometry but also in other methods of learning about surfaces, interfaces, thin films, nanostructures, and bulk materials under both static and dynamic conditions through the use of polarized light.

The meeting will be held on the campus of the University of Colorado at Boulder.  The campus is in the foothills of the Rocky Mountains, and is about an hour away from the Denver Airport by public transportation.  Boulder is known for its blend of urban and outdoor activities, including a vibrant downtown and talented brewers and chefs.  The pedestrian Pearl Street Mall includes numerous art galleries, cafes, restaurants, and boutiques.  In addition to spectacular scenery, Boulder provides a wealth of recreational opportunities including biking and hiking.  The Rocky Mountain National Park is about 1 ½ hours away.

Organizing Committee

Mathias Schubert

University of Nebraska-Lincoln (USA) & Lund University (Sweden)

David E. Aspnes

North Carolina State University (USA)

Alain C. Diebold

CNSE, University at Albany, SUNY (USA)

Eva Franke-Schubert

University of Nebraska-Lincoln (USA)
Workforce and Sponsoring Chair

Markus Raschke

University of Colorado at Boulder (USA)
Local Chair

0

Years

:

0

Months

:

0

Days

:

0

Hours

:

0

Minutes

:

0

Secs

Visitor Map

Visitor Map
  • Fourth Announcement

    Dear colleagues,

    The ICSE-10 official website is now online.

    Stay tuned for important updates about the abstract submission timeline, conference schedule, award nominations, and speaker invitations.

    At this time we anticipate ICSE-10 to be a fully in-person meeting.

    Please encourage your colleagues and collaborators interested in participating to subscribe to our website icse10.ellipsometry.us

    Please direct questions and inquiries to icse10@ellipsometry.us

    We look forward to welcoming you to Boulder, Colorado June 8-13 2025.

    The ICSE-10 organizers

  • Third Announcement

    We proudly announce the 10th International Conference on Spectroscopic Ellipsometry ICSE10 which will be held in Colorado, U.S.A., June 8-13, 2025. The main organizing team consists of Eva Schubert from the University of Nebraska-Lincoln, David Aspnes from North Carolina State University, Alain Diebold from University at Albany, SUNY  and Mathias Schubert also from Nebraska.

    ICSE is a conference series which was founded in 1993 and is held every three years to share new ideas related to ellipsometry applications such as materials characterization, real-time process analysis, and instrumentation development utilizing the polarization properties of electromagnetic waves in the spectral region from Terahertz to soft-X-ray wavelengths. The conference brings together an international cohort of experienced scientists and leaders of the community, as well as many graduate students, PostDoc’s, and other early career professionals.

    ICSE-10 is committed to the development of a collaborative, inclusive, diverse, and internationally conscious workforce, and is seeking opportunities to increase participation of a diverse and inclusive population of undergraduate and graduate students, but also PostDoc’s, and early career professionals.

    Please mark your calendars and stay tuned for further information. A website will be launched soon and abstract submission details will be provided.

    We look forward to welcoming you in Colorado in 2025!

    Eva Schubert, David Aspnes, Alain Diebold, and Mathias Schubert

  • Second Announcement

  • First Announcement

    Dear Spectroscopic Ellipsometry Community,

    We look forward to welcoming you to ICSE-10, which will be held 08-13 June 2025 at the Conference Center of the University of Colorado – Boulder. Boulder is located at the base of the foothills of the Rocky Mountains, less than a one-hour drive from the Denver Airport.

    ICSE-10 will follow the organization of previous ICSE conferences. Honorary, Advisory, Program, and Local Arrangements Committees will be formed over the next few months and tasked with specific responsibilities. Volunteers are gladly accepted.

    We will be sending you further informational Emails once the ICSE-10 Website has been established and more details become available.

    We look forward to seeing you there!

    Mathias Schubert (University of Nebraska, Lincoln)
    David Aspnes (North Carolina State University)
    Alain Diebold (CNSE, SUNY Polytechnic Institute)

  • Event Venue

    ICSE-10 will be held at the University of Colorado’s University Memorial Center (UMC) in Boulder, Colorado, USA. The main conference events and a simultaneous industry exhibition will take place in the Glenn Miller Ballroom and the adjacent Aspen Rooms.

  • Participation Support

    Assistance may be provided to subsidize registration fees, travel, or accommodation for selected students and early-career professionals.

Tentative Scope & Topics

Theory

  • Artificial Intelligence and Machine Learning
  • Data Analysis
  • Fast data processing
  • Optical Modeling (Finite Element, ab-initio, …)
  • Subwavelength Structure Analysis and Modeling
  • Time-dependence

Instrumentation

  • Imaging Ellipsometry and High-Resolution
  • Metrology
  • Mueller-Matrix Spectroscopy
  • New Developments
  • Nonlinear and Time-Resolved Ellipsometry
  • THz and Extreme Ultraviolet

Applications

  • Advanced Semiconductor Metrology
  • Anisotropy and Anisotropic Materials
  • Artificial Intelligence and Machine Learning
  • Bio- and Life-Sciences
  • Correlated Systems
  • Chemistry and Biochemistry
  • Ferroelectrics, Piezoelectrics, Ferromagnetics, Antiferromagnetics, Multiferroics
  • High-Entropy Materials
  • Imaging
  • Interfaces
  • Liquid Crystals
  • Mueller-Matrix Polarimetry and Scatterometry
  • Nanomaterials
  • Optical Properties
  • Organics and Polymers
  • Photovoltaics and Renewable Energy Materials
  • Quantum Materials and Materials for Quantum Applications
  • Real-time Process Monitoring and Control
  • Two-Dimensional Systems
  • Keynote & Invited Speakers

    Sessions with presentations by Keynote & Invited Speakers will take place Monday, June 9, through Friday, June 13, 2025.

    Keynote Speakers

    University of Colorado Boulder (USA)

    Keynote Title Coming Soon

    University at Albany, SUNY (USA)

    Mueller-Matrix Spectroscopic Ellipsometry based Scatterometry: Optical Dimensional and Shape Analysis

    Fudan University (China)

    Half a Century of Spectroscopic Ellipsometry in China

    Huazhong University of Science and Technology (China)

    Advanced Mueller-Matrix Ellipsometry: Instrumentation and Emerging Applications

    Lund University (Sweden) 

    THz Spectroscopic Ellipsometry and Its Future

    New Mexico State University (USA)

    Accurate Measurements of Optical Constants using Temperature-Dependent Ellipsometry and Comparison with k.p Theory

    Invited Speakers

    David Aspnes

    North Carolina State University (USA)

    Removing Noise from Spectra: The Next 100 Years.

    Shirly Espinoza

    ELI Beamlines (Czech Republic)

    Approaching Ultrafast Phenomena in Materials by Time-Resolved Ellipsometry

    Kurt Hingerl

    Johannes Kepler University Linz (Austria)

    Can Imaging Ellipsometry Beat the Diffraction Limit?

    Ufuk Kilic

    University of Nebraska-Lincoln (USA)

    Metamaterial Platforms: Harnessing Spectrally Controllable Strong Chiroptical Activity and Beyond

    MyungJun Lee

    Samsung (South Korea)

    New Spectroscopic Ellipsometry Instrumentation for Application to the Semiconductor Industry

    Peter Petrik

    University of Debrecen (Hungary)

    Low-Dimensional, Combinatorial and Periodic Structures for Sensing Catalysis – Characterization of Interface Process by In-Situ Spectroscopic Ellipsometry

    Angelo Pierangelo

    Institut Polytechnique De Paris (France)

    Fast, High-Resolution Integrated Multispectral Mueller Ellipsometry for In-Vivo Biomedical Diagnostics

    Viktor Rindert

    Lund University (Sweden)

    Exploring Paramagnetic Resonance through Mueller-Matrix Ellipsometry

    Chris Sturm

    Universität Leipzig (Germany)

    Electromagnetic Waves in Optically Anisotropic Media: Presence and Propagation of Singular States

Logo of the Platinum Sponsor: University of Nebraska-Lincoln, Department of Electrical and Computer Engineering
  • Tutorials

    ICSE-10 will offer one day of complimentary Tutorials and a Welcome Reception on Sunday, June 8, 2025.

    CNRS, École Polytechnique (France)

    Imaging Mueller Polarimetry: From Metrology to Biomedicine

    University of Nebraska-Lincoln (USA) & Lund University (Sweden)

    The Eigenpolarization Model: A physics approach to render the susceptibility tensors of anisotropic materials

    The University of Toledo (USA)

    Data Analysis:  Turning Bad Models into Good Results

    Eindhoven University of Technology (The Netherlands)

    In-Situ Spectroscopic Ellipsometry during Atomic Layer Deposition and Related Processes

    Florida International University (USA)

    Artificial Intelligence and Machine Learning in Ellipsometry

  • Workforce Development

    ICSE-10 dedicates a Special Session to aspects of workforce development for students and early-career professionals. This session may include a panel discussion where global leaders from science and industry answer questions about their understanding of current and future trends, as well as best practices in processes that create value.

    ONTO Innovation (USA)

    Have Polarizer – Will Travel: The Need for Ellipsometry Expertise in Industry

    Semiconductor Foundation (USA)

    Workforce Development for Semiconductor Industry

  • Awards

    ICSE-10 will introduce new student as well as life-time achievement awards. Students must indicate their status upon registration in order to partake in the best oral presentation and best poster competitions. Life-time achievement awards will bring remembrance to early pioneers in the field and highlight the importance of historical developments.

    ICSE-10 will feature the following awards in recognition of excellent achievements at different levels.

  • Exhibitor Information

    ICSE-10 will feature an exhibition that runs from Monday to Thursday and offers a range of booth sizes in the Aspen Rooms near the main venue. Included amenities are tables, power access, WiFi, and security. Exhibit rates vary from Platinum to Bronze. Further sponsorship is encouraged through various events. Sponsors are greatly appreciated as a vital element to the community and the success of ICSE-10.

Logo of the Arbeitskreis Ellipsometrie (AKE) - Paul Drude e.V.