• Committees

    Organizing Committee

    Mathias Schubert

    University of Nebraska-Lincoln (USA) & Lund University (Sweden)

    David E. Aspnes

    North Carolina State University (USA)

    Alain C. Diebold

    CNSE, University at Albany, SUNY (USA)

    Eva Franke-Schubert

    University of Nebraska-Lincoln (USA)

    Local Committee

    David E. AspnesNorth Carolina State University (USA)
    Alain DieboldCNSE, University at Albany, SUNY (USA)
    Tino HofmannNorth Carolina State University at Charlotte (USA)
    Marcel JunigeUniversity of Colorado at Boulder (USA)
    Ufuk KilicUniversity of Nebraska-Lincoln (USA)
    Alyssa MockWeber State University (USA)
    Nikolas PodrazaThe University of Toledo (USA)
    Eva SchubertUniversity of Nebraska-Lincoln (USA)
    Mathias Schubert (Chair)University of Nebraska-Lincoln (USA)
    Megan StokeyMilwaukee School of Engineering (USA)

    Honorary Committee

    David E. Aspnes (Chair)North Carolina State University (USA)
    John A. WoollamJ. A. Woollam Co. Inc. Lincoln Nebraska (USA)
    Hans ArwinEmeritus Professor of Applied Optics, Linkoping University (Sweden)
    Ilsin AnHanyang University (South Korea)
    Robert W. CollinsDistinguished University Professor of Physics Emeritus
    (USA)
    Bernard DrevillonÉcole PolytechniqueCNRS (France)
    Josef HumlíčekMasaryk University (Czech Republic)
    Harland G. TompkinsRetired (USA)
    Gang JinInstitute of Mechanics (China)
    Uwe BeckRetired (Germany)
    Gerald E. JellisonRetired (USA)

    Award Committee

    Vanya Darakchieva (Chair)Lund University (Sweden)
    Eva Franke-SchubertUniversity of Nebraska-Lincoln (USA)
    Alyssa MockWeber State University (USA)
    TBATBA

    Advisory Committee

    Alain Diebold (Chair)CNSE, University at Albany, SUNY (USA)
    Maria Isabel AlonsoInstitute of Materials Science of Barcelona (Spain)
    Vanya DarakchievaLund University (Sweden)
    Adil DenizliHacettepe University (Turkey)
    Norbert EsserLeibniz Institute for Analytical Sciences (Germany)
    Fried MiklósHungarian Academy of Sciences (Hungary)
    Hiroyuki FujiwaraNational Institute of Advanced Industrial Science and Technology (Japan)
    Miquel GarrigaInstitute of Materials Science of Barcelona (Spain)
    Kurt HingerlCenter for Surface and Nanoanalysis (Austria)
    Josef HumlíčekMasaryk University (Czechia)
    Gerald E. JellisonRetired (USA)
    Gang JinChinese Academy of Sciences (China)
    Erwin (W.M.M.) KesselsEindhoven Univ. of Technology (The Netherlands)
    Shiyuan LiuHuazhong University of Science and Technology (China)
    Maria LosurdoNational Research Council (Italy)
    Ivan OhlídalMasaryk University (Czech Republic)
    Nikolas PodrazaThe University of Toledo (USA)
    Andrei SirenkoNew Jersey Institute of Technology (USA)
    Masato TazawaNational Institute of Advanced Industrial Science and Technology (Japan)
    Frank UrbanFlorida International University (USA)
    Stefan ZollnerNew Mexico State University (USA)

    Program Committee

    Mathias Schubert (Chair)University of Nebraska-Lincoln (USA)
    Oriol ArteagaUniversity of Barcelona (Spain)
    Christian BernhardUniversity of Fribourg (Switzerland)
    Eva BittrichLeibniz Institute of Polymer Research Dresden (Germany)
    Mariano Campoy-QuilesInstitute of Materials Science of Barcelona (Spain)
    Christoph CobetJohannes Kepler University Linz (Austria)
    Jorge M. Palma CorreiaUniversity of Lisbon (Portugal)
    Martin FenebergOtto von Guericke University of Magdeburg (Germany)
    Thomas A. GermerNational Institute of Standards and Technology (USA)
    Andreas HertwigFederal Institute for Materials Research and Testing (Germany)
    Tino HofmannUniversity of North Carolina at Charlotte (USA)
    Kenneth JärrendahlLinköping University (Sweden)
    Morten KildemoNorwegian University of Science and Technology (Norway)
    Daesuk KimChonbuk National University (South Korea)
    Young Dong KimKyung Hee University (South Korea)
    Hsiang-Lin LiuNational Taiwan Normal University (Taiwan)
    Long Van LeHanoi Academy of Science and Technology (Vietnam)
    Arturo Mendoza-GalvánNational Polytechnic Institute (Mexico)
    Mircea ModreanuUniversity College Cork (Ireland)
    Tatiana NovikovaÉcole Polytechnique (France)
    Wojciech OgiegłoKing Abdullah University of Science and Technology (Saudi Arabia)
    Razvigor OssikovskiÉcole Polytechnique (France)
    Péter PetrikHungarian Academy of Sciences (Hungary)
    Jessica C. Ramella-RomanFlorida International University (USA)
    Chris SturmLeipzig University (Germany)
    Ana S. VianaUniversity of Lisbon (Portugal)
    Herbert WormeesterUniversity of Twente (Netherlands)
    Juan Antonio ZapienCity University of Hong Kong (China)
    Alyssa MockWeber State University (USA)
    Shirly Josefina Espinoza HerreraCzech Academy of Sciences (Czechia)
    Carola EmmingerLeipzig University (Germany)
    Daniel SchmidtIBM (USA)
    Ruediger Schmidt-GrundTechnische Universität Ilmenau (Germany)
    Andreas FurchnerHelmholtz-Zentrum Berlin (Germany)
    Steffen RichterLund University (Sweden)
    Honggang GuHuazhong University of Science and Technology (China)
    Premysl MarsikUniversity of Fribourg (Switzerland)
    Łukasz SkowrońskiBydgoszcz University of Science and Technology (Poland)
    Georgy ErmolaevXPANCEO (United Arab Emirates)
    Xiuguo ChenHuazhong University of Science and Technology (China)
  • Third Announcement

    We proudly announce the 10th International Conference on Spectroscopic Ellipsometry ICSE10 which will be held in Colorado, U.S.A., June 8-13, 2025. The main organizing team consists of Eva Schubert from the University of Nebraska-Lincoln, David Aspnes from North Carolina State University, Alain Diebold from University at Albany, SUNY  and Mathias Schubert also from Nebraska.

    ICSE is a conference series which was founded in 1993 and is held every three years to share new ideas related to ellipsometry applications such as materials characterization, real-time process analysis, and instrumentation development utilizing the polarization properties of electromagnetic waves in the spectral region from Terahertz to soft-X-ray wavelengths. The conference brings together an international cohort of experienced scientists and leaders of the community, as well as many graduate students, PostDoc’s, and other early career professionals.

    ICSE-10 is committed to the development of a collaborative, inclusive, diverse, and internationally conscious workforce, and is seeking opportunities to increase participation of a diverse and inclusive population of undergraduate and graduate students, but also PostDoc’s, and early career professionals.

    Please mark your calendars and stay tuned for further information. A website will be launched soon and abstract submission details will be provided.

    We look forward to welcoming you in Colorado in 2025!

    Eva Schubert, David Aspnes, Alain Diebold, and Mathias Schubert

  • Second Announcement

  • First Announcement

    Dear Spectroscopic Ellipsometry Community,

    We look forward to welcoming you to ICSE-10, which will be held 08-13 June 2025 at the Conference Center of the University of Colorado – Boulder. Boulder is located at the base of the foothills of the Rocky Mountains, less than a one-hour drive from the Denver Airport.

    ICSE-10 will follow the organization of previous ICSE conferences. Honorary, Advisory, Program, and Local Arrangements Committees will be formed over the next few months and tasked with specific responsibilities. Volunteers are gladly accepted.

    We will be sending you further informational Emails once the ICSE-10 Website has been established and more details become available.

    We look forward to seeing you there!

    Mathias Schubert (University of Nebraska, Lincoln)
    David Aspnes (North Carolina State University)
    Alain Diebold (CNSE, SUNY Polytechnic Institute)

Logo of the Platinum Sponsor: J.A. Woollam Co., Inc.
Logo of the Platinum Sponsor: University of Nebraska-Lincoln, Department of Electrical and Computer Engineering
Logo of the U.S. National Science Foundation
Logo of the Arbeitskreis Ellipsometrie (AKE) - Paul Drude e.V.