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Tutorials

On Sunday, June 8, 2025, complimentary Tutorials will kick-off ICSE-10 with outstanding scientists teaching introductory and advanced aspects in emerging areas.

CNRS, École Polytechnique (France)

Imaging Mueller Polarimetry: From Metrology to Biomedicine

Dr. Tatiana Novikova leads the Division of Characterization and Modeling at the Laboratory of Physics of Interfaces and Thin Films of CNRS, Ecole polytechnique, Institut Polytechnique de Paris, France. She is a Courtesy Professor of the Department of Biomedical Engineering, Florida International University, Miami, FL, USA. Dr Novikova obtained MSc degree in applied mathematics from the Moscow State University (Russia), PhD in applied mathematics and physics from the Moscow Institute of Mathematical Modelling (Russia), and Habilitation in Physics from the University Paris-Sud (France). Her research interests and area of expertise include optical polarization, Mueller polarimetry, biomedical imaging, polarimetric instrumentation, optical metrology and computational modeling of electromagnetic wave interaction with structured and random media. Dr. Novikova is an Editorial Board member of the SPIE Journal of Biomedical Optics, co-Editor of the book “Polarized Light in Biomedical Imaging and Sensing – Clinical and Pre-Clinical Applications” (Springer Cham, 2023), Vice-Chair of SPIE Poincaré Webinar Series on Optical Polarization and Related Phenomena. Dr. Novikova is the Fellow of SPIE and Optica (former OSA), and the recipient of 2020 SPIE G. G. Stokes Award in optical polarization.

The University of Toledo (USA)

Data Analysis:  Turning Bad Models into Good Results

Nik received his BS and MS degrees in Physics in 2003 and 2004 from the Pennsylvania State University and his PhD in Physics in 2008 from the University of Toledo. In 2011, he joined the faculty at University of Toledo where his current research involves optical characterization of materials and thin film devices, complex optical property measurements from the millimeter to ultraviolet wavelength ranges, in situ real time monitoring of materials growth, non-contacting probes of electronic transport properties, thin film photovoltaics, and modeling of opto-electronic devices. Nik is currently the NEG Endowed Chair Professor and Chair of the Department of Physics and Astronomy at the University of Toledo.

Eindhoven University of Technology (The Netherlands)

In-Situ Spectroscopic Ellipsometry during Atomic Layer Deposition and Related Processes

Erwin Kessels received his M.Sc. and Ph.D. degree in Applied Physics from the Eindhoven University of Technology (TU/e) in 1996 and 2000, respectively. He is currently a professor at the same university and his research interests cover the field of synthesis of ultrathin films and nanostructures using methods such as layer deposition (ALD) and atomic layer etching (ALE). He has contributed most prominently by his work on plasma-enhanced ALD, his research related to ALD for semiconductor technology and photovoltaics, ALD for nanopatterning, and in situ spectroscopic studies of ALD and ALE. Erwin has won several awards (the AVS Peter Mark Memorial Award in 2007; the ALD Innovation Award in 2019) and he is an associate editor of the Journal of Vacuum Science and Technology. He is also the driving force behind the AtomicLimits.com blog and the founder of the ALD Academy.

Florida International University (USA)

Artificial Intelligence and Machine Learning in Ellipsometry

Professor Frank Urban received his BSEE and MS in Electrical Engineering from The Ohio State University, and MS and PhD in Materials Science and Engineering from the University of Florida. After working for Harris Semiconductor Frank joined the University of Miami’s Department of Electrical Engineering as Assistant Professor. He then joined the Department of Electrical and Computer Engineering at Florida International University as Associate Professor. Frank’s interest include thin film formation using Ionized Cluster Beam, Nanoparticle films, and others (1980 – present), characterization of materials’ properties using ellipsometry (1980 – present), and modeling methods including numerical methods and artificial intelligence for function approximation (1992 – present). Fields of interest comprise nanoparticles, optics, endocrinology, and computer Matlab©. He also enjoys triathlon racing, cycling, and wilderness hiking.

University of Nebraska-Lincoln (USA) & Lund University (Sweden)

The Eigenpolarization Model: A physics approach to render the susceptibility tensors of anisotropic materials

Mathias received Dipl.-Phys., Dr. rer. nat., and Dr. habil. (Physics) degrees from the University of Leipzig in 1994, 1997, and 2003, respectively. He joined the University of Nebraska-Lincoln as full-time faculty in 2005. He visited Linkoping University as guest professor (2016-2022) and Lund University (2023-). He was named Fellow of the Leibniz Institut fuer Polymerforschung Dresden and the American Physical Society. Mathias holds an honorary doctorate from Linkoping University and he is endowed with the J.A. Woollam Distinguished Professorship Chair. He serves as Commissioning Editor for Applied Physics Letters. Mathias’ research interests cover development and applications of advanced ellipsometry.


On Sunday, June 8, 2025, after a full day of Tutorials, an Evening Reception will welcome our community from around the world in the warm atmosphere of the historic Chautauqua Dining Hall at the base of Boulder’s iconic Flatirons.

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  • Fifth Announcement

    The international community of ellipsometry enthusiasts is set to meet at the 10th International Conference on Spectroscopic Ellipsometry (ICSE-10), scheduled for June 8-13, 2025, in Boulder, Colorado. This premier event serves as a platform for the

    • exchange of scientific and technological knowledge and recent advancements.
    • collaboration among professionals from academia, government, and industry.
    • development of an inclusive workforce for the future.

    ICSE-10 brings together a diverse group of experienced scientists and leaders, early career professionals, postdocs, plus graduate and undergraduate students—all in a breathtaking surrounding at the foothills of the Rocky Mountains.

    As Conference Registration is fast approaching, registration fees are currently anticipated at a rate of $900 for regular and $500 for student attendees, including all activities at no extra costs to participants. Please start preparing your arrangements for travel and accommodation. A block of reduced rates in Hotels is currently being negotiated. A budget of low-cost beds in Campus Lodging may subsidize selected early-career and student attendees.

    The comprehensive Technical Program will include a broad range of aspects in the field of ellipsometry and polarimetry, as well as related applications utilizing the polarization properties of light. Topics cover theory, instrumentation, and applications across physics, chemistry, material science, and life sciences, as well as engineering and metrology.

    Sunday, complimentary Tutorials will kick-off ICSE-10 with outstanding scientists teaching introductory and advanced aspects in emerging areas:

    Tatiana Novikova (Tutorial):
    Imaging Mueller Polarimetry: From Metrology to Biomedicine

    Mathias Schubert (Tutorial):
    The Eigenpolarization Model: A Physics Approach to Render the Susceptibility Tensors of Anisotropic Materials

    Nikolas Podraza (Tutorial):
    Data Analysis: Turning Bad Models into Good Results

    Erwin Kessels (Tutorial):
    In-Situ Spectroscopic Ellipsometry during Atomic Layer Deposition and Related Processes

    Frank Urban (Tutorial):
    Artificial Intelligence and Machine Learning in Ellipsometry

    An Evening Reception will welcome our community from around the world in the warm atmosphere of the historic Chautauqua Dining Hall at the base of Boulder’s iconic Flatirons.

    Monday through Friday, Oral and Poster Sessions will take place in the Glenn Miller Ballroom, including an excellent lineup of Keynote & Invited Speakers:

    Steven M. George (Keynote):
    In-Situ Spectroscopic Ellipsometry Studies of Selective Atomic Layer Deposition and Etch Processes

    Alain Diebold (Keynote):
    Mueller-Matrix Spectroscopic Ellipsometry based Scatterometry: Optical Dimensional and Shape Analysis

    Yu-Xiang Zheng (Keynote):
    Half a Century of Spectroscopic Ellipsometry in China

    Shiyuan Liu (Keynote):
    Advanced Mueller-Matrix Ellipsometry: Instrumentation and Emerging Applications

    Vanya Darakchieva (Keynote):
    THz Spectroscopic Ellipsometry and Its Future

    Stefan Zollner (Keynote):
    Accurate Measurements of Optical Constants using Temperature-Dependent Ellipsometry and Comparison with k.p Theory

    David Aspnes (Invited):
    Removing Noise from Spectra: The Next 100 Years.

    Shirly Espinoza (Invited):
    Approaching Ultrafast Phenomena in Materials by Time-Resolved Ellipsometry

    Kurt Hingerl (Invited):
    Can Imaging Ellipsometry Beat the Diffraction Limit?

    Ufuk Kilic (Invited):
    Metamaterial Platforms: Harnessing Spectrally Controllable Strong Chiroptical Activity and Beyond

    Taeyong Jo (Invited):
    New Spectroscopic Ellipsometry Instrumentation for Application to the Semiconductor Industry

    Peter Petrik (Invited):
    Low-Dimensional, Combinatorial and Periodic Structures for Sensing Catalysis – Characterization of Interface Process by In-Situ Spectroscopic Ellipsometry

    Angelo Pierangelo (Invited):
    Fast, High-Resolution Integrated Multispectral Mueller Ellipsometry for In-Vivo Biomedical Diagnostics

    Viktor Rindert (Invited):
    Exploring Paramagnetic Resonance through Mueller-Matrix Ellipsometry

    Chris Sturm (Invited):
    Electromagnetic Waves in Optically Anisotropic Media: Presence and Propagation of Singular States

    A special session will be dedicated to aspects of Workforce Development for early-career professionals and students alike:

    Andy Antonelli (Keynote):
    Have Polarizer – Will Travel: The Need for Ellipsometry Expertise in Industry

    Shari Liss (Keynote):
    Workforce Development for Semiconductor Industry

    Refreshments will be served during session breaks and during poster sessions. Lunch will be served Sunday through Thursday.

    Wednesday, an Excursion to the Georgetown Loop Railroad will bring all attendees aboard an original 19th-century train steaming along old gold miners tracks and leaving fond memories for a lifetime. Afterwards, the Conference Dinner will offer an authentic American experience in the Byron R. White Club with spectacular views over Folsom Field, the home stadium of the Colorado Buffaloes football team.

    On Friday, the Awards ceremony will honor

    • a young scientist for exceptional contributions with the Paul Drude Award.
    • a senior community member for pioneering, lifetime achievements with the Hans Mueller Memorial Award and Lecture.
    • an individual, research group, company, or institution for outstanding innovation and creativity with the Innovation and Creativity Award.
    • students for the best oral presentation and the best poster with respective Student Awards.

    ICSE-10 will also feature a simultaneous, week-long Industry Exhibition in the Aspen Rooms next to the main venue. The organizers and attendees are grateful for a growing List of Sponsors that make this event possible.

    The organizing Committees look forward to seeing you in Boulder, Colorado, soon!

  • Fourth Announcement

    Dear colleagues,

    The ICSE-10 official website is now online.

    Stay tuned for important updates about the abstract submission timeline, conference schedule, award nominations, and speaker invitations.

    At this time we anticipate ICSE-10 to be a fully in-person meeting.

    Please encourage your colleagues and collaborators interested in participating to subscribe to our website icse10.ellipsometry.us

    Please direct questions and inquiries to icse10@ellipsometry.us

    We look forward to welcoming you to Boulder, Colorado June 8-13 2025.

    The ICSE-10 organizers

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