The Technical Program will cover all aspects in the fields of ellipsometry and polarimetry, or other applications that use polarization properties of light. The range of topics cover broad areas from Artificial Intelligence, Machine Learning, Biological, Chemical, Physical, and Material Sciences to Life Sciences as well as wide engineering developments and metrology applications.
Tentative Scope & Topics
Theory
- Artificial Intelligence and Machine Learning
- Data Analysis
- Fast data processing
- Optical Modeling (Finite Element, ab-initio, …)
- Subwavelength Structure Analysis and Modeling
- Time-dependence
Instrumentation
- Imaging Ellipsometry and High-Resolution
- Metrology
- Mueller-Matrix Spectroscopy
- New Developments
- Nonlinear and Time-Resolved Ellipsometry
- THz and Extreme Ultraviolet
Applications
- Advanced Semiconductor Metrology
- Anisotropy and Anisotropic Materials
- Artificial Intelligence and Machine Learning
- Bio- and Life-Sciences
- Correlated Systems
- Chemistry and Biochemistry
- Ferroelectrics, Piezoelectrics, Ferromagnetics, Antiferromagnetics, Multiferroics
- High-Entropy Materials
- Imaging
- Interfaces
- Liquid Crystals
- Mueller-Matrix Polarimetry and Scatterometry
- Nanomaterials
- Optical Properties
- Organics and Polymers
- Photovoltaics and Renewable Energy Materials
- Quantum Materials and Materials for Quantum Applications
- Real-time Process Monitoring and Control
- Two-Dimensional Systems
Special Events
- Exhibitor Presentations
- Hans Mueller Memorial Award/Lecture
- Paul Drude Award Ceremony
- Plenary Reviews
- Poster Sessions
- Tutorials
- Workforce Development Panel
