Ellipsometry and associated optical measurements with polarization sensitivity have become essential techniques for characterizing the properties of surfaces, interfaces, and thin films. Since its founding in 1993, the series of International Conferences on Spectroscopic Ellipsometry (ICSE) has evolved into the premier international meeting of professionals in the field of ellipsometry and related techniques. The attendees’ high-quality contributions have been continuously published as peer-reviewed articles in special issues of renowned scientific journals. The following list links to the proceedings of previous ICSE conferences.
9th International Conference on Spectroscopic Ellipsometry (ICSE-9):
May 22-28, 2022, in Beijing, China
8th International Conference on Spectroscopic Ellipsometry (ICSE-8):
May 26-31, 2019, in Barcelona, Spain
7th International Conference on Spectroscopic Ellipsometry (ICSE-7):
June 6-10, 2016, in Berlin, Germany
6th International Conference on Spectroscopic Ellipsometry (ICSE-VI):
May 26-31, 2013, in Kyoto, Japan
5th International Conference on Spectroscopic Ellipsometry (ICSE-V):
May 23-29, 2010, 2010, in Albany, NY, USA
4th International Conference on Spectroscopic Ellipsometry (ICSE-4):
June 11-15, 2007, in Stockholm, Sweden
3rd International Conference on Spectroscopic Ellipsometry (ICSE-3):
July 6-11, 2003, in Vienna, Austria
2nd International Conference on Spectroscopic Ellipsometry (ICSE-2):
May 12-15, 1997, in Charleston, SC, USA
1st International Conference on Spectroscopic Ellipsometry (ICSE-1):
January 11-14, 1993, in Paris, France