ICSE Conferences are the premiere meetings on the use of polarized light as a diagnostic of surfaces, interfaces, thin films, nanostructures, and bulk materials. The Technical Program will cover all aspects in the fields of ellipsometry and polarimetry, or other applications that use polarization properties of light. The range of topics cover broad areas from Artificial Intelligence, Machine Learning, Biological, Chemical, Physical, and Material Sciences to Life Sciences as well as wide engineering developments and metrology applications.
Tentative Scope & Topics
Theory
- Artificial Intelligence and Machine Learning
- Data Analysis
- Fast data processing
- Optical Modeling (Finite Element, ab-initio, …)
- Subwavelength Structure Analysis and Modeling
- Time-dependence
Instrumentation
- Imaging Ellipsometry and High-Resolution
- Metrology
- Mueller-Matrix Spectroscopy
- New Developments
- Nonlinear and Time-Resolved Ellipsometry
- THz and Extreme Ultraviolet
Applications
- Advanced Semiconductor Metrology
- Anisotropy and Anisotropic Materials
- Artificial Intelligence and Machine Learning
- Bio- and Life-Sciences
- Correlated Systems
- Chemistry and Biochemistry
- Ferroelectrics, Piezoelectrics, Ferromagnetics, Antiferromagnetics, Multiferroics
- High-Entropy Materials
- Imaging
- Interfaces
- Liquid Crystals
- Mueller-Matrix Polarimetry and Scatterometry
- Nanomaterials
- Optical Properties
- Organics and Polymers
- Photovoltaics and Renewable Energy Materials
- Quantum Materials and Materials for Quantum Applications
- Real-time Process Monitoring and Control
- Two-Dimensional Systems
Special Events
- Exhibitor Presentations
- Hans Mueller Memorial Award/Lecture
- Paul Drude Award Ceremony
- Plenary Reviews
- Poster Sessions
- Tutorials
- Workforce Development Panel
Tentative Scope and Topics
Tutorials
Plenary Reviews
Theory
Artificial Intelligence and Machine Learning
Data Analysis
Fast data processing
Optical Modeling (Finite Element, ab-initio, …)
Subwavelength Structure Analysis and Modeling
Time-dependence
Instrumentation
Imaging Ellipsometry and High-Resolution
Metrology
Mueller-Matrix Spectroscopy
New Developments
Nonlinear and Time-Resolved Ellipsometry
THz and Extreme Ultraviolet
Applications
Advanced Semiconductor Metrology
Anisotropy and Anisotropic Materials
Artificial Intelligence and Machine Learning
Bio- and Life-Sciences
Correlated Systems
Chemistry and Biochemistry
Ferroelectrics, Piezoelectrics, Ferromagnetics, Antiferromagnetics, Multiferroics
High-Entropy Materials
Imaging
Interfaces
Liquid Crystals
Mueller-Matrix Polarimetry and Scatterometry
Nanomaterials
Optical Properties
Organics and Polymers
Photovoltaics and Renewable Energy Materials
Quantum Materials and Materials for Quantum Applications
Real-time Process Monitoring and Control
Two-Dimensional Systems
Special Events
Exhibitor Presentations
Hans Mueller Memorial Award/Lecture
Paul Drude Award Ceremony
Poster Sessions
Workforce Development Panel
