Logo of the U.S. National Science Foundation
Logo of the Platinum Sponsor: J.A. Woollam Co., Inc.

Committees

Organizing Committee

Mathias Schubert

University of Nebraska-Lincoln (USA) & Lund University (Sweden)

David E. Aspnes

North Carolina State University (USA)

Alain C. Diebold

CNSE, University at Albany, SUNY (USA)

Eva Franke-Schubert

University of Nebraska-Lincoln (USA)
Workforce and Sponsoring Chair

Markus Raschke

University of Colorado at Boulder (USA)
Local Chair

Local Committee

Markus Raschke (Chair)University of Colorado at Boulder (USA)
David E. AspnesNorth Carolina State University (USA)
Alain DieboldCNSE, University at Albany, SUNY (USA)
Tino HofmannNorth Carolina State University at Charlotte (USA)
Marcel JunigeUniversity of Colorado at Boulder (USA)
Ufuk KilicUniversity of Nebraska-Lincoln (USA)
Alyssa MockWeber State University (USA)
Nikolas PodrazaThe University of Toledo (USA)
Eva SchubertUniversity of Nebraska-Lincoln (USA)
Megan StokeyMilwaukee School of Engineering (USA)

Honorary Committee

David E. Aspnes (Chair)North Carolina State University (USA)
John A. WoollamJ. A. Woollam Co. Inc. Lincoln Nebraska (USA)
Hans ArwinEmeritus Professor of Applied Optics, Linkoping University (Sweden)
Ilsin AnHanyang University (South Korea)
Robert W. CollinsDistinguished University Professor of Physics Emeritus (USA)
Bernard DrevillonÉcole Polytechnique, CNRS (France)
Josef HumlíčekMasaryk University (Czech Republic)
Harland G. TompkinsRetired (USA)
Gang JinInstitute of Mechanics (China)
Uwe BeckRetired (Germany)
Gerald E. JellisonRetired (USA)

Award Committee

Vanya Darakchieva (Chair)Lund University (Sweden)
Maria Isabel AlonsoInstitute of Materials Science of Barcelona (Spain)
Hiroyuki FujiwaraGifu University (Japan)
Marius GrundmannUniversity Leipzig (Germany)
Shiyuan LiuHuazhong University of Science and Technology (China)
Alyssa MockWeber State University (USA)
Péter PetrikHungarian Academy of Sciences (Hungary)
Stefan SchoecheIBM Research (USA)
Stefan ZollnerNew Mexico State University (USA)

Advisory Committee

Alain Diebold (Chair)CNSE, University at Albany, SUNY (USA)
Maria Isabel AlonsoInstitute of Materials Science of Barcelona (Spain)
Vanya DarakchievaLund University (Sweden)
Adil DenizliHacettepe University (Turkey)
Norbert EsserLeibniz Institute for Analytical Sciences (Germany)
Fried MiklósHungarian Academy of Sciences (Hungary)
Hiroyuki FujiwaraNational Institute of Advanced Industrial Science and Technology (Japan)
Miquel GarrigaInstitute of Materials Science of Barcelona (Spain)
Kurt HingerlCenter for Surface and Nanoanalysis (Austria)
Josef HumlíčekMasaryk University (Czechia)
Gerald E. JellisonRetired (USA)
Gang JinChinese Academy of Sciences (China)
Erwin (W.M.M.) KesselsEindhoven Univ. of Technology (The Netherlands)
Shiyuan LiuHuazhong University of Science and Technology (China)
Maria LosurdoNational Research Council (Italy)
Ivan OhlídalMasaryk University (Czech Republic)
Nikolas PodrazaThe University of Toledo (USA)
Andrei SirenkoNew Jersey Institute of Technology (USA)
Masato TazawaNational Institute of Advanced Industrial Science and Technology (Japan)
Frank UrbanFlorida International University (USA)
Stefan ZollnerNew Mexico State University (USA)

Program Committee

Mathias Schubert (Chair)University of Nebraska-Lincoln (USA)
Oriol ArteagaUniversity of Barcelona (Spain)
Christian BernhardUniversity of Fribourg (Switzerland)
Eva BittrichLeibniz Institute of Polymer Research Dresden (Germany)
Mariano Campoy-QuilesInstitute of Materials Science of Barcelona (Spain)
Christoph CobetJohannes Kepler University Linz (Austria)
Jorge M. Palma CorreiaUniversity of Lisbon (Portugal)
Martin FenebergOtto von Guericke University of Magdeburg (Germany)
Thomas A. GermerNational Institute of Standards and Technology (USA)
Andreas HertwigFederal Institute for Materials Research and Testing (Germany)
Tino HofmannUniversity of North Carolina at Charlotte (USA)
Kenneth JärrendahlLinköping University (Sweden)
Morten KildemoNorwegian University of Science and Technology (Norway)
Daesuk KimJeonbuk National University (South Korea)
Young Dong KimKyung Hee University (South Korea)
Hsiang-Lin LiuNational Taiwan Normal University (Taiwan)
Long Van LeHanoi Academy of Science and Technology (Vietnam)
Arturo Mendoza-GalvánNational Polytechnic Institute (Mexico)
Mircea ModreanuUniversity College Cork (Ireland)
Tatiana NovikovaÉcole Polytechnique (France)
Wojciech OgiegłoKing Abdullah University of Science and Technology (Saudi Arabia)
Razvigor OssikovskiÉcole Polytechnique (France)
Péter PetrikHungarian Academy of Sciences (Hungary)
Jessica C. Ramella-RomanFlorida International University (USA)
Chris SturmLeipzig University (Germany)
Ana S. VianaUniversity of Lisbon (Portugal)
Herbert WormeesterUniversity of Twente (Netherlands)
Juan Antonio ZapienCity University of Hong Kong (China)
Alyssa MockWeber State University (USA)
Shirly Josefina Espinoza HerreraCzech Academy of Sciences (Czechia)
Carola EmmingerLeipzig University (Germany)
Daniel SchmidtIBM (USA)
Ruediger Schmidt-GrundTechnische Universität Ilmenau (Germany)
Andreas FurchnerHelmholtz-Zentrum Berlin (Germany)
Steffen RichterLund University (Sweden)
Honggang GuHuazhong University of Science and Technology (China)
Premysl MarsikUniversity of Fribourg (Switzerland)
Łukasz SkowrońskiBydgoszcz University of Science and Technology (Poland)
Georgy ErmolaevXPANCEO (United Arab Emirates)
Xiuguo ChenHuazhong University of Science and Technology (China)
Logo of the Platinum Sponsor: University of Nebraska-Lincoln, Department of Electrical and Computer Engineering
  • Sixth Announcement

    ICSE-10 Online Registration

    Registration for the upcoming 10th International Conference on Spectroscopic Ellipsometry (ICSE-10) is now open.

    Registration Fees are set at a rate of

    • $900 for Regular attendees,
    • $500 for Student attendees, and
    • $300 for Accompanying Guests for Social Events.

    These Fees include all activities of the Technical Program and Social Events at no extra costs to participants.

    Please register on the ICSE-10 Online Registration website before May 22, 2025!

    Late Breaking Abstracts

    The Program Committee is currently reviewing submitted abstracts. Authors will be informed about their abstract’s acceptance or rejection as soon as possible. Abstracts will be included in an Abstract Booklet to be published on the conference website soon.

    Meanwhile, the Abstract Submission system remains open for Late Breaking Abstracts until April 1, 2025.

    Please encourage your senior, early-career, and student peers to Submit an Abstract now!

    Sponsorship Opportunities

    ICSE-10’s comprehensive Technical Program and outstanding Social Events are a must-attend for every ellipsometry enthusiast across theory, instrumentation, and applications alike. Organizers and attendees are grateful for a growing List of Sponsors that make this event possible.

    Please refer to the Prospectus for sponsorship opportunities.

    Please stay tuned for further information regarding discounted Hotel or low-cost Campus LodgingAttendance Support, and Presenter Guidelines, which will be provided soon.

    With kind regards,
    Mathias Schubert, University of Nebraska-Lincoln (USA) & Lund University (Sweden)
    David E. Aspnes, North Carolina State University (USA)
    Alain C. Diebold, CNSE, University at Albany, SUNY (USA)
    Eva Franke-Schubert, University of Nebraska-Lincoln (USA)
    Markus Raschke, University of Colorado at Boulder (USA)

  • Fifth Announcement

    The international community of ellipsometry enthusiasts is set to meet at the 10th International Conference on Spectroscopic Ellipsometry (ICSE-10), scheduled for June 8-13, 2025, in Boulder, Colorado. This premier event serves as a platform for the

    • exchange of scientific and technological knowledge and recent advancements.
    • collaboration among professionals from academia, government, and industry.
    • development of an inclusive workforce for the future.

    ICSE-10 brings together a diverse group of experienced scientists and leaders, early career professionals, postdocs, plus graduate and undergraduate students—all in a breathtaking surrounding at the foothills of the Rocky Mountains.

    As Conference Registration is fast approaching, registration fees are currently anticipated at a rate of $900 for regular and $500 for student attendees, including all activities at no extra costs to participants. Please start preparing your arrangements for travel and accommodation. A block of reduced rates in Hotels is currently being negotiated. A budget of low-cost beds in Campus Lodging may subsidize selected early-career and student attendees.

    The comprehensive Technical Program will include a broad range of aspects in the field of ellipsometry and polarimetry, as well as related applications utilizing the polarization properties of light. Topics cover theory, instrumentation, and applications across physics, chemistry, material science, and life sciences, as well as engineering and metrology.

    Sunday, complimentary Tutorials will kick-off ICSE-10 with outstanding scientists teaching introductory and advanced aspects in emerging areas:

    Tatiana Novikova (Tutorial):
    Imaging Mueller Polarimetry: From Metrology to Biomedicine

    Mathias Schubert (Tutorial):
    The Eigenpolarization Model: A Physics Approach to Render the Susceptibility Tensors of Anisotropic Materials

    Nikolas Podraza (Tutorial):
    Data Analysis: Turning Bad Models into Good Results

    Erwin Kessels (Tutorial):
    In-Situ Spectroscopic Ellipsometry during Atomic Layer Deposition and Related Processes

    Frank Urban (Tutorial):
    Artificial Intelligence and Machine Learning in Ellipsometry

    An Evening Reception will welcome our community from around the world in the warm atmosphere of the historic Chautauqua Dining Hall at the base of Boulder’s iconic Flatirons.

    Monday through Friday, Oral and Poster Sessions will take place in the Glenn Miller Ballroom, including an excellent lineup of Keynote & Invited Speakers:

    Steven M. George (Keynote):
    In-Situ Spectroscopic Ellipsometry Studies of Selective Atomic Layer Deposition and Etch Processes

    Alain Diebold (Keynote):
    Mueller-Matrix Spectroscopic Ellipsometry based Scatterometry: Optical Dimensional and Shape Analysis

    Yu-Xiang Zheng (Keynote):
    Half a Century of Spectroscopic Ellipsometry in China

    Shiyuan Liu (Keynote):
    Advanced Mueller-Matrix Ellipsometry: Instrumentation and Emerging Applications

    Vanya Darakchieva (Keynote):
    THz Spectroscopic Ellipsometry and Its Future

    Stefan Zollner (Keynote):
    Accurate Measurements of Optical Constants using Temperature-Dependent Ellipsometry and Comparison with k.p Theory

    David Aspnes (Invited):
    Removing Noise from Spectra: The Next 100 Years.

    Shirly Espinoza (Invited):
    Approaching Ultrafast Phenomena in Materials by Time-Resolved Ellipsometry

    Kurt Hingerl (Invited):
    Can Imaging Ellipsometry Beat the Diffraction Limit?

    Ufuk Kilic (Invited):
    Metamaterial Platforms: Harnessing Spectrally Controllable Strong Chiroptical Activity and Beyond

    Taeyong Jo (Invited):
    New Spectroscopic Ellipsometry Instrumentation for Application to the Semiconductor Industry

    Peter Petrik (Invited):
    Low-Dimensional, Combinatorial and Periodic Structures for Sensing Catalysis – Characterization of Interface Process by In-Situ Spectroscopic Ellipsometry

    Angelo Pierangelo (Invited):
    Fast, High-Resolution Integrated Multispectral Mueller Ellipsometry for In-Vivo Biomedical Diagnostics

    Viktor Rindert (Invited):
    Exploring Paramagnetic Resonance through Mueller-Matrix Ellipsometry

    Chris Sturm (Invited):
    Electromagnetic Waves in Optically Anisotropic Media: Presence and Propagation of Singular States

    A special session will be dedicated to aspects of Workforce Development for early-career professionals and students alike:

    Andy Antonelli (Keynote):
    Have Polarizer – Will Travel: The Need for Ellipsometry Expertise in Industry

    Shari Liss (Keynote):
    Workforce Development for Semiconductor Industry

    Refreshments will be served during session breaks and during poster sessions. Lunch will be served Sunday through Thursday.

    Wednesday, an Excursion to the Georgetown Loop Railroad will bring all attendees aboard an original 19th-century train steaming along old gold miners tracks and leaving fond memories for a lifetime. Afterwards, the Conference Dinner will offer an authentic American experience in the Byron R. White Club with spectacular views over Folsom Field, the home stadium of the Colorado Buffaloes football team.

    On Friday, the Awards ceremony will honor

    • a young scientist for exceptional contributions with the Paul Drude Award.
    • a senior community member for pioneering, lifetime achievements with the Hans Mueller Memorial Award and Lecture.
    • an individual, research group, company, or institution for outstanding innovation and creativity with the Innovation and Creativity Award.
    • students for the best oral presentation and the best poster with respective Student Awards.

    ICSE-10 will also feature a simultaneous, week-long Industry Exhibition in the Aspen Rooms next to the main venue. The organizers and attendees are grateful for a growing List of Sponsors that make this event possible.

    The organizing Committees look forward to seeing you in Boulder, Colorado, soon!

Logo of the Arbeitskreis Ellipsometrie (AKE) - Paul Drude e.V.